Atomic force microscope in a contactless mode: Peculiarities of force interactions

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.26, Iss.6, 2000-06, pp. : 517-519

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Nanotubes and force interactions in an atomic force microscope

By Dedkov G. Rekhviashvili S.

Technical Physics, Vol. 44, Iss. 8, 1999-08 ,pp. : 982-985

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

A Novel Atomic Force Microscope with Multi-Mode Scanner

Journal of Physics: Conference Series , Vol. 680, Iss. 1, 2016-01 ,pp. : 43-46

IOP Publishing

Access to resources Recommend Favorite

Nanolithography with an atomic force microscope

By Wendel M. Irmer B. Cortes J. Kaiser R. Lorenz H. Kotthaus J.P. Lorke A. Williams E.

Superlattices and Microstructures, Vol. 20, Iss. 3, 1996-10 ,pp. : 349-356

Academic Press

Access to resources Recommend Favorite

Measurement of the probe impact force of the atomic force microscope operating in the amplitude modulation mode

By Shcherbin B. Ankudinov A. Kiyuts A. Loboda O.

Physics of the Solid State, Vol. 56, Iss. 3, 2014-03 ,pp. : 531-537

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Measuring energies with an Atomic Force Microscope

EPL (EUROPHYSICS LETTERS), Vol. 74, Iss. 1, 2006-04 ,pp. : 110-116

Edp Sciences

Access to resources Recommend Favorite