Electron structure of thin fullerene films deposited by various methods

Author： Shakhmin A. Khodorkovskii A. Murashov S. Artamonova T. Golod A.

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.27, Iss.2, 2001-02, pp. : 87-89

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Electron structure and elemental composition of thin films of europium deposited at room temperature on a Si(100)2 × 1 surface

By Varykhalov A. Kuzmin M. Mittsev M.

Technical Physics Letters, Vol. 31, Iss. 1, 2005-01 ,pp. : 51-54

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Fullerene films deposited by evaporation in vacuum using spot-focused annular electron beam

By Semenov A. Semenova I. Bulina N. Krylov A. Churilov G. Semenova A.

Technical Physics Letters, Vol. 31, Iss. 12, 2005-12 ,pp. : 1036-1038

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

The effects of hydrogen dilution on structure of Si:H thin films deposited by PECVD

Journal of Physics: Conference Series , Vol. 187, Iss. 1, 2009-09 ,pp. : 244-249

IOP Publishing

Access to resources Recommend Favorite

Electron spectroscopy of fluoridated fullerene films

By Shakhmin A. Baranov N. Khodorkovskii M. Murashov S.

Physics of the Solid State, Vol. 40, Iss. 1, 1998-01 ,pp. : 150-153

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Zinc oxide thin films deposited by magnetron sputtering with various oxygen/argon concentrations

Journal of Physics: Conference Series , Vol. 370, Iss. 1, 2012-06 ,pp. : 153-159

IOP Publishing

Access to resources Recommend Favorite