Variation of the reflection coefficient of semiconductors in a wavelength range from 0.2 to 20 μm under the action of ultrasonic waves

Author： Zaveryukhin B.   Zaveryukhina N.   Tursunkulov O.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.28, Iss.9, 2002-09, pp. : 752-756

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