The diffraction focusing of X-rays upon backscattering from a bent crystal covered with epitaxial film: Sensitivity with respect to the interplanar spacing mismatch between film and substrate
Author： Tchen T.
Publisher： MAIK Nauka/Interperiodica
ISSN： 1063-7850
Source： Technical Physics Letters, Vol.29, Iss.2, 2003-02, pp. : 125-127
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