Damage of integrated circuits by high-velocity microparticles penetrating thick-wall obstacles

Author: Roman O.   Dybov O.   Romanov G.   Usherenko S.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.31, Iss.1, 2005-01, pp. : 46-47

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next