Use of the anisotropic magnetoresistance effect for direct measurement of the coercivity and exchange bias fields of magnetization reversal in conducting magnetic films of nanometer thickness

Author: Medved A.   Kryshtal R.   Krikunov A.   Kasatkin S.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.31, Iss.10, 2005-10, pp. : 875-877

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