Diagnostics of highly doped czochralski-grown silicon crystals

Author: Kyutt R.   Ruvimov S.   Shulpina I.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.32, Iss.12, 2006-12, pp. : 1079-1082

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