Cluster diagnostics in Si1−x Ge x solid solutions using low-energy ion backscattering spectroscopy

Author: Babenko P.   Shergin A.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.33, Iss.5, 2007-05, pp. : 377-379

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