Studying electric field profiles in GaAs-based detector structures by Kelvin probe force microscopy

Author： Vilisova M.   Germogenov V.   Kaztaev O.   Novikov V.   Ponomarev I.   Titkov A.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.36, Iss.5, 2010-05, pp. : 436-438

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