Method for evaluating the parameters of radiation defects and predicting the radiation resistance of MOS transistors

Author： Levin M.   Bondarenko E.   Bormontov A.   Tatarintsev A.   Gitlin V.  

Publisher： MAIK Nauka/Interperiodica

ISSN： 1063-7850

Source： Technical Physics Letters, Vol.36, Iss.8, 2010-08, pp. : 703-705

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