Applying PSO-based BPN for predicting the yield rate of DRAM modules produced using defective ICs

Author： Lee Zne-Jung Ying Kuo-Ching Chen Shih-Chieh Lin Shih-Wei

ISSN： 0268-3768

Source： The International Journal of Advanced Manufacturing Technology, Vol.49, Iss.9-12, 2010-08, pp. : 987-999

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