A generalized formulation of the linear sampling method with exact characterization of targets in terms of farfield measurements

Author: Audibert Lorenzo   Haddar Houssem  

Publisher: IOP Publishing

ISSN: 0266-5611

Source: Inverse Problems, Vol.30, Iss.3, 2014-03, pp. : 35011-35030

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next