Evaluation of the performance correlated defects of metamorphic InGaAs photodetector structures through plane-view EBIC

Author: Zhang Yong-gang   Liu Ke-hui   Gu Yi   Zhou Li   Li Hsby   Chen Xing-you   Cao Yuan-ying   Xi Su-ping  

Publisher: IOP Publishing

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.29, Iss.3, 2014-03, pp. : 35018-35026

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