Flat-band voltage and low-field mobility analysis of junctionless transistors under low-temperature

Author: Joo Min-Kyu   Mouis Mireille   Jeon Dae-Young   Barraud Sylvain     Kim Gyu-Tae   Ghibaudo Gérard  

Publisher: IOP Publishing

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.29, Iss.4, 2014-04, pp. : 45024-45036

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