Author: Bae Changdeuck Böhnert Tim Gooth Johannes Lim Seulky Lee Seonhee Kim Hyunchul Heimann Stefan Schulz Stephan Shin Hyunjung Nielsch Kornelius
Publisher: IOP Publishing
ISSN: 0268-1242
Source: Semiconductor Science and Technology, Vol.29, Iss.6, 2014-06, pp. : 64003-64009
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