Multifunctional nanoanalytics and long-range scanning probe microscope using a nanopositioning and nanomeasuring machine

Author： Vorbringer-Dorozhovets N   Goj B   Machleidt T   Franke K-H   Hoffmann M   Manske E  

Publisher： IOP Publishing

ISSN： 0957-0233

Source： Measurement Science and Technology, Vol.25, Iss.4, 2014-04, pp. : 44006-44012

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