Atom probe tomography study of Mg-doped GaN layers

Author： Khromov S Gregorius D Schiller R Lösch J Wahl M Kopnarski M Amano H Monemar B Hultman L Pozina G

ISSN： 0957-4484

Source： Nanotechnology, Vol.25, Iss.27, 2014-07, pp. : 275701-275706

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