EON: software for long time simulations of atomic scale systems

Author： Chill Samuel T Welborn Matthew Terrell Rye Zhang Liang Berthet Jean-Claude Pedersen Andreas Jónsson Hannes Henkelman Graeme

Publisher： IOP Publishing

ISSN： 0965-0393

Source： Modelling and Simulation in Materials Science and Engineering, Vol.22, Iss.5, 2014-07, pp. : 55002-55017

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