Author: Fanyang Li Hao Jiang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.35, Iss.3, 2014-03, pp. : 35006-35014
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
CMOS blocks for on-chip RF test
Analog Integrated Circuits and Signal Processing, Vol. 49, Iss. 2, 2006-11 ,pp. :