Predicting high quantiles through the Dirichlet process on extreme modelling

Author： de Waal D.J.   Beirlant J.   Dierckx G.  

Publisher： 光谱学与光谱分析编辑部

ISSN： 0038-271X

Source： The South African Statistical Journal, Vol.42, Iss.2, 2008-08, pp. : 101-124

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