Voltammetric and X-ray diffraction analysis of the early stages of the thermal crystallization of mixed Cu,Mn oxides

Author： Grygar T. Rojka T. Bezdička P. Večerníková E. Kovanda F.

ISSN： 1432-8488

Source： Journal of Solid State Electrochemistry, Vol.8, Iss.4, 2004-03, pp. : 252-259

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