Atomic Force Microscopy Analysis of Statistical Roughness of GaAs Surfaces Originated by Thermal Oxidation

Author： Klapetek Petr   Ohlídal Ivan   Navrátil Karel  

Publisher： Springer Publishing Company

ISSN： 0026-3672

Source： Microchimica Acta, Vol.147, Iss.3, 2004-06, pp. : 175-180

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Related content

Solid-State Reactions during Thermal Oxidation of Vanadium-Modified GaAs Surfaces

By  

Inorganic Materials, Vol. 40, Iss. 5, 2004-05 ,pp. : 441-444

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

Influence of a Thiolate Chemical Layer on GaAs (100) Biofunctionalization: An Original Approach Coupling Atomic Force Microscopy and Mass Spectrometry Methods

By Bienaime Alex   Leblois Therese   Gremaud Nicolas   Chaudon Maxime-Jean   Osta Marven El   Pecqueur Delphine   Ducoroy Patrick   Elie-Caille Celine  

Materials, Vol. 6, Iss. 11, 2013-10 ,pp. : 4946-4966

MDPI

Access to resources Recommend Favorite

Pull-off Force Measurements between Rough Surfaces by Atomic Force Microscopy

By Beach E.R.   Tormoen G.W.   Drelich J.   Han R.  

Journal of Colloid and Interface Science, Vol. 247, Iss. 1, 2002-03 ,pp. : 84-99

Academic Press

Access to resources Recommend Favorite

Quantitative Analysis of Fluid Interface–Atomic Force Microscopy

By Aston D.E.   Berg J.C.  

Journal of Colloid and Interface Science, Vol. 235, Iss. 1, 2001-03 ,pp. : 162-169

Academic Press

Access to resources Recommend Favorite

A New Application of Atomic Force Microscopy: The Visualization of Coke on Selective Oxidation Catalysts

By Gaigneaux E.M.   Ruiz P.   Wolf E.E.   Delmon B.  

Journal of Catalysis, Vol. 172, Iss. 1, 1997-11 ,pp. : 247-251

Academic Press

Access to resources Recommend Favorite