A Novel Method of Analytical Transmission Electron Microscopy for Measuring Highly Accurately Segregation to Special Grain Boundaries or Planar Interfaces

Author： Walther Thomas   Rečnik Aleksander   Daneu Nina  

Publisher： Springer Publishing Company

ISSN： 0026-3672

Source： Microchimica Acta, Vol.155, Iss.1-2, 2006-09, pp. : 313-318

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