XPS depth profiling investigations on La₂Zr₂O₇ layers prepared by chemical solution deposition

Author： Oswald Steffen Knoth Kerstin Holzapfel Bernhard

ISSN： 0026-3672

Source： Microchimica Acta, Vol.156, Iss.1-2, 2006-11, pp. : 121-124

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