Material Characterization of Ge_1−xSn_x Alloys Grown by a Commercial CVD System for Optoelectronic Device Applications

Author： Mosleh Aboozar Ghetmiri Seyed Conley Benjamin Hawkridge Michael Benamara Mourad Nazzal Amjad Tolle John Yu Shui-Qing Naseem Hameed

Publisher： Springer Publishing Company

ISSN： 1543-186X

Source： Journal of Electronic Materials, Vol.43, Iss.4, 2014-04, pp. : 938-946

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