Simplified method for the evaluation of the reverse dark current–voltage characteristic of thin film devices
Publisher： John Wiley & Sons Inc
E-ISSN： 1521-3951|252|9|2129-2141
ISSN： 0370-1972
Source： PHYSICA STATUS SOLIDI (B) BASIC SOLID STATE PHYSICS, Vol.252, Iss.9, 2015-09, pp. : 2129-2141
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Access to resources
Recommend
