![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Publisher: John Wiley & Sons Inc
E-ISSN: 1467-7687|18|5|853-862
ISSN: 1363-755x
Source: DEVELOPMENTAL SCIENCE (ELECTRONIC), Vol.18, Iss.5, 2015-09, pp. : 853-862
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Bayesian Approaches to Imputation, Hypothesis Testing, and Parameter Estimation
LANGUAGE LEARNING, Vol. 65, Iss. S1, 2015-06 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Sensitivity of flood damage estimation to spatial resolution
JOURNAL OF FLOOD RISK MANAGEMENT, Vol. 11, Iss. S1, 2018-01 ,pp. :