Refining a model electron‐density map via the Phantom Derivative method

Publisher： John Wiley & Sons Inc

E-ISSN： 1399-0047|71|9|1864-1871

ISSN： 0907-4449

Source： ACTA CRYSTALLOGRAPHICA SECTION D (ELECTRONIC), Vol.71, Iss.9, 2015-09, pp. : 1864-1871

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