One‐Electron Oxidation of a Disilicon(0) Compound: An Experimental and Theoretical Study of [Si2]+ Trapped by N‐Heterocyclic Carbenes

Publisher: John Wiley & Sons Inc

E-ISSN: 1521-3765|21|35|12509-12516

ISSN: 0947-6539

Source: CHEMISTRY - A EUROPEAN JOURNAL, Vol.21, Iss.35, 2015-08, pp. : 12509-12516

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Abstract