A combined FEG-SEM and TEM study of silicon nanodot assembly

Author： Donnadieu P.   Roussel F.   Cocheteau V.   Caussat B.   Mur P.   Scheid E.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|44|1|11-19

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.44, Iss.1, 2008-04, pp. : 11-19

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