Imaging atomically sharp crack tips in mica by contact mode AFM under ambient conditions

Author： Gan Y.   Chu W.   Qiao L.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|31|1|37-44

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.31, Iss.1, 2005-04, pp. : 37-44

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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