Dislocations in 6H-SiC and their influence on electrical propertiesof n-type crystals*

Author： Tillay V.   Pailloux F.   Denanot M. F.   Pirouz P.   Rabier J.   Demenet J. L.   Barbot J. F.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|2|2|111-115

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.2, Iss.2, 2010-03, pp. : 111-115

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