Confrontation between noise and dielectric measurements on a liquid crystal in the paraelectric SA andferroelectric SC* phases

Author: Douali R.   Leroy G.   Gest J.   Legrand C.   Tabourier P.   Nguyen H. T.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|9|1|25-28

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.9, Iss.1, 2010-03, pp. : 25-28

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Abstract