Characterization of small cracks in eddy current testing*

Author: Le Bihan Y.   Pávó J.   Marchand C.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|43|2|231-237

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.43, Iss.2, 2008-06, pp. : 231-237

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Abstract