Author: Delaere K. Heylen W. Belmans R. Hameyer K.
Publisher: Edp Sciences
E-ISSN: 1286-0050|13|2|115-119
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.13, Iss.2, 2010-03, pp. : 115-119
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Abstract
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