Impact of ultra-thinning on DC characteristics of MOSFET devices

Author： Pinel S.   Lépinois F.   Cazarré A.   Tasselli J.   Marty A.   Bailbé J. P.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|17|1|41-43

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.17, Iss.1, 2010-03, pp. : 41-43

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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