Cathodoluminescence microanalysis of porous GaP and InP structures

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Characterization and Ultrafiltration of Semiconductor Indium Phosphide (InP) Wastewater for Recycling

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Environmental Technology, Vol. 26, Iss. 1, 2005-01 ,pp. : 111-119

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Annealing ambient controlled deep defect formation in InP

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Investigation of compensation defect centres in semi-insulating InP crystals

By Kaminski P.   Pawlowski M.   Kozłowski R.   Surma B.   Dubecky F.   Yamada M.   Fukuzawa M.  

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Characterisation of 2D photonic crystals cavities on InP membranes*

By Grillet C.   Pottier P.   Letartre X.   Seassal C.   Rojo-Romeo P.   Viktorovitch P.   M. Le Vassor d'Yerville D.   Cassagne C.  

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