Optical second harmonic imaging: a versatile tool to investigate semiconductor surfaces and interfaces

Author： Scheidt T.   Rohwer E. G.   von Bergmann H. M.   Stafast H.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|27|1-3|393-397

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 393-397

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