A binary classification methodology applicable to defects detection.Boosting algorithms

Author： Marie-Joseph I.   Oukaour A.   Clergeot H.   Primerose A.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|12|1|61-74

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.12, Iss.1, 2010-03, pp. : 61-74

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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