Determination of localized trap parameters in organic semiconductors using charge based deep level transient spectroscopy (Q-DLTS)

Author： Nguyen T. P.   Ip J.   Gaudin O.   Jackman R. B.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|27|1-3|219-222

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 219-222

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