Extended generation profile - E.B.I.C model application in the case of a PN junction

Author: Guermazi S.   Toureille A.   Grill C.   El Jani B.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|9|1|43-49

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.9, Iss.1, 2010-03, pp. : 43-49

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Abstract