Ultrasonically stimulated temperature rise around dislocation: extended defect mapping and imaging

Author： Savkina R. K.   Smirnov A. B.   Tetyorkin V. V.   Krolevec N. M.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|27|1-3|375-377

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 375-377

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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