Comparative study on residual strain profiles in GaAs substrates grown by LEC and VB techniques

Author： Kawase T. Tatsumi M. Fukuzawa M. Yamada M.

E-ISSN： 1286-0050|27|1-3|353-356

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 353-356

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