Author: Fakhfakh S. Jbara O. Belhaj M. Fakhfakh Z. Kallel A. Rau E. I.
Publisher: Edp Sciences
E-ISSN: 1286-0050|21|2|137-146
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.21, Iss.2, 2003-02, pp. : 137-146
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
The Use of the Scanning Electron Microscope
International Materials Reviews, Vol. 18, Iss. 1, 1973-03 ,pp. :
Closed-Loop Autofocus Scheme for Scanning Electron Microscope
By Cui Le
MATEC Web of conference, Vol. 32, Iss. issue, 2015-12 ,pp. :
By Blockwell S.J. Taylor E.J. Phillips D.R. Turner M. Pascoe D.
Ecotoxicology and Environmental Safety, Vol. 35, Iss. 3, 1996-12 ,pp. :
Electron beam irradiation processing for industrial and medical applications
EPJ Web of Conference, Vol. 154, Iss. issue, 2017-09 ,pp. :