Characterization of reactively evaporated TiO₂ thin films as high and medium index layers for optical applications

Author： Asghar M. H. Placido F. Naseem S.

E-ISSN： 1286-0050|35|3|177-184

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.35, Iss.3, 2006-07, pp. : 177-184

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