Metrological analysis of shearography*

Author: Taillade F.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|35|2|145-148

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.35, Iss.2, 2006-07, pp. : 145-148

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract