Author: Taillade F.
Publisher: Edp Sciences
E-ISSN: 1286-0050|35|2|145-148
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.35, Iss.2, 2006-07, pp. : 145-148
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
The measurement of the modal strain fields using digital shearography
By Lopes H.
EPJ Web of Conference, Vol. 6, Iss. issue, 2010-06 ,pp. :
A novel phase shift technique in shearography for NDT
By Liu Z.
EPJ Web of Conference, Vol. 6, Iss. issue, 2010-06 ,pp. :
A metrological hierarchy for analytical chemistry
TrAC Trends in Analytical Chemistry, Vol. 18, Iss. 1, 1999-01 ,pp. :