Author: Sahlaoui M. Ayadi A. Fazouan N. Addou M. Djafari Rouhani M. Estève D.
Publisher: Edp Sciences
E-ISSN: 1286-0050|13|3|171-176
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.13, Iss.3, 2010-03, pp. : 171-176
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
By Romanyuk V.R. Kondratenko O.S. Kondratenko S.V. Kotko A.V. Dmitruk N.L.
EPJ Applied Physics (The), Vol. 56, Iss. 1, 2011-09 ,pp. :
By Sani Zara Khosousi Ghodsi Farhad Esmaeli Mazloom Jamal
EPJ Applied Physics (The), Vol. 74, Iss. 1, 2016-04 ,pp. :
By Sani Zeinab Khosousi Ghodsi Farhad Esmaeli Mazloom Jamal
EPJ Applied Physics (The), Vol. 74, Iss. 3, 2016-06 ,pp. :
Molecular dynamics simulation of amorphous SiO2 thin films
By Thi Nhu Tranh Duong Van Hoang Vo
EPJ Applied Physics (The), Vol. 70, Iss. 1, 2015-04 ,pp. :