Author: Alfonso C. Fares L. Huiban Y. Gallet D. Ismeurt M. Charaï A.
Publisher: Edp Sciences
E-ISSN: 1286-0050|22|1|3-10
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.22, Iss.1, 2003-04, pp. : 3-10
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Abstract
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