Optimization of accelerated testing through design of experiment for ageing of lead-free electronic interconnection material

Author: Catelani M.   Scarano V.L.   Berni R.  

Publisher: Edp Sciences

E-ISSN: 2107-6847|4|1|47-54

ISSN: 2107-6839

Source: International Journal of Metrology and Quality Engineering, Vol.4, Iss.1, 2013-06, pp. : 47-54

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Abstract