The yield estimation of semiconductor products based on truncated samples

Author: Gu K.   Jia X.Z.   You H.L.   Liang T.  

Publisher: Edp Sciences

E-ISSN: 2107-6847|4|3|215-220

ISSN: 2107-6839

Source: International Journal of Metrology and Quality Engineering, Vol.4, Iss.3, 2014-03, pp. : 215-220

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